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ISSN:
2221-870X
Disciplines
(Field of Science):
- automation, electronics, electrical engineering and space technologies (Engineering and Technology)
- biomedical engineering (Engineering and Technology)
- civil engineering, geodesy and transport (Engineering and Technology)
- mechanical engineering (Engineering and Technology)
- astronomy (Natural sciences)
(Field of Science)
Ministry points: Help
| Year | Points | List |
|---|---|---|
| Year 2024 | 40 | Ministry scored journals list 2024 |
| Year | Points | List |
|---|---|---|
| 2024 | 40 | Ministry scored journals list 2024 |
| 2023 | 40 | Ministry Scored Journals List |
| 2022 | 40 | Ministry Scored Journals List 2019-2022 |
| 2021 | 40 | Ministry Scored Journals List 2019-2022 |
| 2020 | 40 | Ministry Scored Journals List 2019-2022 |
| 2019 | 40 | Ministry Scored Journals List 2019-2022 |
| 2018 | 0 | unscored |
| 2017 | 0 | unscored |
| 2016 | 0 | unscored |
| 2015 | 0 | unscored |
| 2014 | 0 | unscored |
| 2013 | 0 | unscored |
Model:
Open Access
Points CiteScore:
| Year | Points |
|---|---|
| Year 2023 | 2.5 |
| Year | Points |
|---|---|
| 2023 | 2.5 |
| 2022 | 2 |
| 2021 | 1.5 |
| 2020 | 1.3 |
| 2019 | 1.3 |
| 2018 | 1.3 |
| 2017 | 0.8 |
| 2016 | 0.5 |
| 2015 | 0.3 |
Impact Factor:
n/a
Papers published in journal
Filters
total: 1
Catalog Journals
Year 2014
-
Two‐functional μBIST for Testing and Self‐Diagnosis of Analog Circuits in Electronic Embedded Systems
PublicationThe paper concerns the testing of analog circuits and blocks in mixed‐signal Electronic Embedded Systems (EESs), using the Built‐in Self‐Test (BIST) technique. An integrated, two‐functional, embedded microtester (μBIST) based on reuse of signal blocks already present in an EES, such as microprocessors, memories, ADCs, DACs, is presented. The novelty of the μBIST solution is its extended functionality. It can perform 2 testing functions:...
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