Integrated circuit structure surface images obtained with contact capacitive imaging technique - Open Research Data - Bridge of Knowledge

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Integrated circuit structure surface images obtained with contact capacitive imaging technique

Description

The measurements were done using NTEGRA Prima (NT-MDT) device. CSG 10Pt probe.

Scanning capacitance microscopy (SCM) is a type of scanning probe microscopy in which a probe is placed in contact with or in close proximity to the sample surface and scanned. The SCM characterizes the sample surface on the basis of information obtained from the change in capacity between the surface and the probe. Applications of the SCM technique include the mapping of the doping profile in semiconductor devices and the assessment of local dielectric properties in insulating layers. The presented images refer to the study of the dielectric properties of the protective conformal coating on the surface of an integrated circuit. The file contains 66 images.

Dataset file

Set10.mdt
8.0 MB, S3 ETag 3ea2fea155ca4c5dcb3fc1d440c46289-1, downloads: 48
The file hash is calculated from the formula
hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.

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https://github.com/antespi/s3md5

File details

License:
Creative Commons: by-nc 4.0 open in new tab
CC BY-NC
Non-commercial
Software:
Gwyddion

Details

Year of publication:
2021
Verification date:
2021-04-29
Dataset language:
English
Fields of science:
  • chemical sciences (Natural sciences)
DOI:
DOI ID 10.34808/dp3d-wq26 open in new tab
Series:
Verified by:
Gdańsk University of Technology

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