Structure and optical measurements of Eu doped tellurium oxide thin films - Open Research Data - Bridge of Knowledge

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Structure and optical measurements of Eu doped tellurium oxide thin films

Description

Thin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method.  Morphology of the samples was observed by atomic force microscope. Doping by europium didn’t change structural parameters. Optical measurements showed photoluminescence from Eu2+ and Eu3+ ions. However, in the spectrum there is no line corresponding to 5D0 -> 7F2 transition due to an electric-dipole transition, usually present in amorphous surrounding.

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TeOx.zip
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Creative Commons: by-nc 4.0 open in new tab
CC BY-NC
Non-commercial
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Details

Year of publication:
2019
Verification date:
2021-05-14
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID https://doi.org/10.1016/j.tsf.2019.137592 open in new tab
Verified by:
Gdańsk University of Technology

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