XRD patterns of V2O5 nanostructures

Description

The DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.

X-ray diffraction patterns (XRD) were collected on a Philips X’PERT PLUS diffractometer with Cu Ka radiation (1.5406 Å) and ranging from 10 to 80 degrees.

These results are part of a project defined in the Journal of Nanomaterials. In this paper, the information about samples and synthesis details are reported.

Dataset file

XRD_annealing temperature.zip

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Attribution
Raw data:: Data contained in dataset was not processed.
Software:: HighScore Plus

Details

Year of publication:

2015

Verification date:

2021-05-25

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/7qds-e175

Series:

Vanadium oxides

Verified by:

Gdańsk University of Technology

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