A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors

Miron Kłosowski; Jacek Jakusz; Waldemar Jendernalik; Grzegorz Blakiewicz; Stanisław Szczepański; Sławomir Kozieł

doi:10.1109/tim.2018.2814118

A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors

Abstract

In this paper, a gray-scale CMOS image sensor (CIS) characterization system with an optimization feature has been proposed. By using a very fast and precise control of light intensity, based on the pulsewidth-modulation method, it is avoided to measure the illuminance every time. These features accelerate the multicriteria CIS optimization requiring many thousands of measurements. The system throughput is 2.5 Gb/s, which allows for capturing images from large arrays of the size 3000 × 3000 pixels at the rate of 25 frames/s, or small arrays (128 × 128) at the rate of 15 000 frames/s. The efficient transfer of measurement data to the external software allows immediate presentation of optimization results in 3-D plots. The system automatically measures nonuniformity, spatial noise, temporal noise, signal-to-noise ratio, dynamic range, nonlinearity and image lag. A flat diffuser has been proposed as a cheaper alternative to an integrating sphere. This optical front-end is particularly useful for testing prototype CISs and vision-chips implemented in standard CMOS technologies as low- or ediumdynamic-range imagers.

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Publication version: Accepted or Published Version
DOI:: Digital Object Identifier (open in new tab) 10.1109/TIM.2018.2814118
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artykuł w czasopiśmie wyróżnionym w JCR

Published in:

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT no. 67, edition 10, pages 2363 - 2372,
ISSN: 0018-9456

Language:

English

Publication year:

2018

Bibliographic description:

Kłosowski M., Jakusz J., Jendernalik W., Blakiewicz G., Szczepański S., Kozieł S.: A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors// IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. -Vol. 67, iss. 10 (2018), s.2363-2372

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