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Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact

Abstract

Nanoimpedance measurements, using the dynamic impedance spectroscopy technique, were carried out during loading and unloading force of a probe on three kinds of materials of different resistivity. These materials were: gold, boron-doped diamond, and AISI 304 stainless steel. Changes of impedance spectra versus applied force were registered and differences in the tip-to-sample contact character on each material were revealed. To enable comparison between materials and phases, a new standardization method is proposed, which simulates conditions of initial contact.

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Category:
Articles
Type:
artykuł w czasopiśmie wyróżnionym w JCR
Published in:
MICROSCOPY AND MICROANALYSIS no. 20, edition 1, pages 72 - 77,
ISSN: 1431-9276
Language:
English
Publication year:
2014
Bibliographic description:
Tobiszewski M., Zieliński A., Darowicki K.: Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact// MICROSCOPY AND MICROANALYSIS. -Vol. 20, iss. 1 (2014), s.72-77
DOI:
Digital Object Identifier (open in new tab) 10.1017/s1431927613013895
Verified by:
Gdańsk University of Technology

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