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(Field of Science)
Ministry points: Help
| Year | Points | List |
|---|---|---|
| Year 2024 | 70 | Ministry scored journals list 2024 |
| Year | Points | List |
|---|---|---|
| 2024 | 70 | Ministry scored journals list 2024 |
| 2023 | 70 | Ministry Scored Journals List |
| 2022 | 70 | Ministry Scored Journals List 2019-2022 |
| 2021 | 70 | Ministry Scored Journals List 2019-2022 |
| 2020 | 70 | Ministry Scored Journals List 2019-2022 |
| 2019 | 70 | Ministry Scored Journals List 2019-2022 |
| 2018 | 45 | A |
| 2017 | 45 | A |
| 2016 | 30 | A |
| 2015 | 35 | A |
| 2014 | 40 | A |
| 2013 | 45 | A |
| 2012 | 45 | A |
| 2011 | 45 | A |
| 2010 | 32 | A |
Model:
Points CiteScore:
| Year | Points |
|---|---|
| Year 2023 | 1.1 |
| Year | Points |
|---|---|
| 2023 | 1.1 |
| 2022 | 2.6 |
| 2021 | 2.6 |
| 2020 | 2.8 |
| 2019 | 2.9 |
| 2018 | 2.4 |
| 2017 | 1.2 |
| 2016 | 1.2 |
| 2015 | 1.2 |
| 2014 | 0.9 |
| 2013 | 2.2 |
| 2012 | 1.1 |
| 2011 | 0.7 |
Impact Factor:
Sherpa Romeo:
Papers published in journal
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total: 7
Catalog Journals
Year 2016
Year 2014
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Application of dynamic impedance spectroscopy to scanning probe microscopy.
PublicationDynamic impedance spectroscopy, designed for measuring nonstationary systems, was used in combination with scanning probe microscopy. Using this approach, impedance mapping could be carried-out simultaneously with topography scanning. Therefore, correlation of electrical properties with particular phases of an examined sample was possible. The sample used in this study was spheroidal graphite cast iron with clearly defined phases...
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Application of Dynamic Impedance Spectroscopy to Scanning Probe Microscopy
Publication -
Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact
PublicationNanoimpedance measurements, using the dynamic impedance spectroscopy technique, were carried out during loading and unloading force of a probe on three kinds of materials of different resistivity. These materials were: gold, boron-doped diamond, and AISI 304 stainless steel. Changes of impedance spectra versus applied force were registered and differences in the tip-to-sample contact character on each material were revealed. To...
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Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode
Publication -
Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode.
PublicationThis study presents a novel approach to impedance measurements. The methodology discussed is limited to contact in the sample-probe system under ambient conditions without the presence of electrolyte. Comparison with results of direct and alternating current measurements for well-defined metallic surfaces are made. In spite of idealization related to the type of contact examined, the proposed technique provides an improvement of...
Year 2012
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Improving AFM images with harmonic interference by spectral analysis
PublicationPrzedstawiono sposób usunięcia zakłóceń pojawiających się na obrazach uzyskiwanych z mikroskopu sił atomowych (AFM). Przybliżono kilka metod stosowanych do redukcji zakłóceń w obrazach. Następnie opisano zidentyfikowane zakłócenia harmoniczne oraz zaproponowany sposób ich znaczącej redukcji. W pracy zamieszczono szereg obrazów uzyskanych z mikroskopu AFM ilustrujących efekty powodowane zakłóceniami oraz skuteczność zaproponowanej...
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