Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode

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Category:: Magazine publication
Type:: Magazine publication
Published in:: MICROSCOPY AND MICROANALYSIS no. 20, edition 03, pages 974 - 981,
ISSN: 1431-9276
ISSN:: 1431-9276
Publication year:: 2014
DOI:: Digital Object Identifier (open in new tab) 10.1017/s1431927614000531
Verified by:: No verification

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