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Abstract
We present methods and problems of noise measurements in electrical double-layer capacitors (EDLC). Detailed noise equivalent electronic circuit is considered, and two possible ways of observations of random processes generated in the EDLCs structures are studied. We conclude that noise is a useful tool for characterization of the EDLC structures and their state-of-health, as in other materials and electronic devices. Eventual, practical applications of noise measurements are proposed to determine the state-of-health of the EDLCs.
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- Accepted or Published Version
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- Copyright (2019 EPFL)
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- Category:
- Conference activity
- Type:
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Language:
- English
- Publication year:
- 2019
- Bibliographic description:
- Smulko J., Szewczyk A., Lentka Ł.: Noise in electrical double-layer capacitors (EDLCs)// / : , 2019,
- DOI:
- Digital Object Identifier (open in new tab) 10.5075/epfl-iclab-icnf-269291
- Sources of funding:
- Verified by:
- Gdańsk University of Technology
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