Search
Best results in : Research Potential Pokaż wszystkie wyniki (1)
Search results for: NSP
-
Zespół Metrologii i Optoelektroniki
Research Potential* komputerowo wspomagana metrologia i diagnostyka * projektowanie systemów * mikrosystemów i makrosystemów elektronicznych * testowanie i diagnostyka elektroniczna * pomiary właściwości szumowych i zakłóceń * spektroskopia impedancyjna * telemetria i telediagnostyka internetowa * katedra redaguje Metrology and Measurement Systems * kwartalnik PAN znajdujący się na liście JCR
Other results Pokaż wszystkie wyniki (11)
Search results for: NSP
-
PEGylated substrates of NSP4 protease: A tool to study protease specificity
Publication -
Nanosecond pulsed electric fields (nsPEFs) impact and enhanced Photofrin II® delivery in photodynamic reaction in cancer and normal cells
Publication -
Transmembrane Transport and Anticancer Activity of Strontium Ranelate Delivered with Nanosecond Pulsed Electric Fields (nsPEFs) into Human Cells in Vitro
Publication -
A new methof for identyfication of RTS noise
PublicationIn the paper a new method, called the Noise Scattering Pattern (NSP) method, for RTS noise identyfication in a noise signal is presented. Examples of patterns of the NSP method are included.
-
A new nethod for RTS noise of semiconductor devices identification
PublicationIn the paper, a new method, called the noise scatterin pattern method (NSP method), for random telegraph signal noise identyfication in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are presented.