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Zespół Metrologii i Optoelektroniki
Research Potential* komputerowo wspomagana metrologia i diagnostyka * projektowanie systemów * mikrosystemów i makrosystemów elektronicznych * testowanie i diagnostyka elektroniczna * pomiary właściwości szumowych i zakłóceń * spektroskopia impedancyjna * telemetria i telediagnostyka internetowa * katedra redaguje Metrology and Measurement Systems * kwartalnik PAN znajdujący się na liście JCR
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High-Resolution, Broad-Range Detection Setup for Polarimetric Optical Fiber Sensors
PublicationA common-path polarization interferometer using a Wollaston prism and an area detector for the measurement of retardation or optical path difference is presented. Employing a moderate-resolution 1280 by 1024 pixel monochrome camera, it offers a measurement range of approximately 780 radians at 830 nm and 1350 radians at 515 nm while maintaining a high measurement resolution. Retardation introduced by a zero-order waveplate or a...
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PHASE OBJECT OBSERVATION SYSTEM BASED ON DIFFRACTION PHASE MICROSCOPY
PublicationIn the paper authors present a special measurement system for observing phase objects. The diffraction phas microscopy makes it possible to measure the dimensions of a tested object with a nanometre resolution. To meet this requirement, it is proposed to apply a spatial transform. The proposed setup can be based either on a two lenses system (called 4 f ) or a Wollaston prism. Both solutions with all construction aspects are described...