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Zespół Metrologii i Optoelektroniki
Research Potential* komputerowo wspomagana metrologia i diagnostyka * projektowanie systemów * mikrosystemów i makrosystemów elektronicznych * testowanie i diagnostyka elektroniczna * pomiary właściwości szumowych i zakłóceń * spektroskopia impedancyjna * telemetria i telediagnostyka internetowa * katedra redaguje Metrology and Measurement Systems * kwartalnik PAN znajdujący się na liście JCR
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Search results for: optocouplers
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Identification of Optocoupler Devices with RTS Noise
PublicationThe results of noise measurements in low frequency range for CNY 17 type optocouplers are presented. The research were carried out on devices with different values of Current Transfer Ratio (CTR). The methods for identification of Random Telegraph Signal (RTS) in noise signal of optocouplers were proposed. It was found that the Noise Scattering Pattern method (NSP method) enables to identify RTS noise as non-Gaussian component...
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Analysis of noise properties of the optocoupler device
PublicationIn the paper the localization of a source of Random Telegraph Signal noise (RTS noise) in optocoupler devices type CNY 17 were defined. The equivalent noise circuit in low frequency noise for these type optocouplers was proposed.
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Identification of inherent noise components of semiconductor devices on an example of optocouplers
PublicationIn the paper, a method of estimation of parameters of Gaussian and non-Gaussian components in the noise signal of semiconductor devices in a frequency domain is proposed. The method is based on composing estimators of two spectra, corresponding to noise (Gaussian component) and two-level RTS noise (non-Gaussian component). The proposed method can be applied for precise evaluation of the corner RTS frequency fRTS in the noise...
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The noise macromodel of an optocoupler including 1/(f^alfa) noise source
PublicationThe course of design of an optocoupler's PSpice macromodel including noise sources is described. The PSpice macromodel is proposed for the low frequency range. The PSpice model of a MOSFET transistor was applied as the noise source type 1/(f^alfa) in an optocoupler PSpice macromodel. In the enhanced macromodel the value of an exponent α can be changed in the range of 0.8 - 1.25.