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Abstract
A new solution of a smart microcontroller sensor based on a simple direct sensor-microcontroller interface for technical objects modeled by two-terminal networks and by the Beaunier’s model of anticorrosion coating is proposed. The tested object is stimulated by a square pulse and its time voltage response is sampled four times by the internal ADC of microcontroller. A neural classifier based on measurement data classifies the tested object to a given degradation stage.
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- Category:
- Articles
- Type:
- artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
- Published in:
-
Przegląd Elektrotechniczny
pages 60 - 63,
ISSN: 0033-2097 - Language:
- English
- Publication year:
- 2017
- Bibliographic description:
- Czaja Z., Kowalewski M.: A compact smart sensor based on a neural classifier for objects modeled by Beaunier's model// Przegląd Elektrotechniczny. -., nr. 10 (2017), s.60-63
- DOI:
- Digital Object Identifier (open in new tab) 10.15199/48.2017.10.14
- Bibliography: test
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- Niedostatkiewicz M., Lentka G., Test frequencies selection criteria for parameter identification of anticorrosion coating using bilinear transformation, 16th IMEKO TC4 Symposium, Florence, Italy, (2008)
- Niedostatkiewicz M., Lentka G., Frequencies selection for accelerated CNLS parameter identification of anticorrosion coatings,
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- Atmel Corporation, Atmel AVR XMEGA AU Manual, (2012), PDF file available from: www.atmel.com
- International Rectifier, IRF7105 HEXFET Power MOSFET, El Segundo, CA, USA, (2003), PDF file available: http://www.irf.com open in new tab
- Czaja Z., A microcontroller system for measurement of three independent components in impedance sensors using a single square pulse, Sensors and Actuators A, 173, (2013), 284-292 open in new tab
- Kowalewski M., Zielonko R., A New Two-center Ellipsoidal Basis Function Neural Network for Fault Diagnosis of Analog Electronic Circuits, Proc. of the 2nd Int. Conf. on Information Technology ICIT 2010, Gdańsk, (2010), 143-146 open in new tab
- Czaja Z., Kowalewski M., An Application of TCRBF Neural Network in Multi-node Fault Diagnosis Method, IMEKO XIX World Congress, Lisbon, Portugal, (2009), 503 -508
- Czaja Z., Kowalewski M., A New Method for Diagnosis of Analog Parts in Electronic Embedded Systems with Two Center Radial Basis Function Neural Networks, 16th IMEKO TC4 Symposium, Florence, Italy, (2008), 743-748 open in new tab
- Verified by:
- Gdańsk University of Technology
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