Search
Abstract
In the paper, a new method, called the noise scatterin pattern method (NSP method), for random telegraph signal noise identyfication in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are presented.
Authors (3)
Cite as
Full text
full text is not available in portal
Keywords
Details
- Category:
- Articles
- Type:
- artykuł w czasopiśmie z listy filadelfijskiej
- Published in:
-
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
no. 57,
pages 1199 - 1206,
ISSN: 0018-9456 - Language:
- English
- Publication year:
- 2008
- Bibliographic description:
- Konczakowska A., Cichosz J., Szewczyk A.: A new nethod for RTS noise of semiconductor devices identification// IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. -Vol. 57., nr. no 6 (2008), s.1199-1206
- Verified by:
- Gdańsk University of Technology
seen 81 times