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An idea of an approach to self-testing of mixed signal systems based on a quadratic function stimulation
Abstract
A new approach to self-testing of the analog parts of mixed-signal electronic systems controlled by microcontrollers equipped with an ADC and a DAC is presented. It is based on a BIST and a new fault diagnosis method. A novelty is the use of the DAC as a component of the BIST, allowing to generate a stimulating signal with a quadratic function shape. It contributes to a better extraction of information about the state of the circuit under test.
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- Category:
- Conference activity
- Type:
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Title of issue:
- XXI IMEKO World Congress – FULL PAPERS strony 532 - 537
- Language:
- English
- Publication year:
- 2015
- Bibliographic description:
- Czaja Z.: An idea of an approach to self-testing of mixed signal systems based on a quadratic function stimulation// XXI IMEKO World Congress – FULL PAPERS/ ed. Assoc. Prof. Jan Holub Praga: Czech Technical University in Prague Faculty of Electrical Engineering, Department of Measurement, 2015, s.532-537
- Verified by:
- Gdańsk University of Technology
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