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A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus
Abstract
A new solution of the JTAG BIST for testing analog circuits in mixed-signal electronic microsystems controlled by microcontrollers and equipped with the IEEE1149.1 bus is presented. It is based on a new fault diagnosis method in which an analog circuit is stimulated by a buffered signal from the TMS line, and the time response of the circuit to this signal is sampled by the ADC equipped with the JTAG. The method can be used for fault detection and single soft fault localization in an analog tested circuit (A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus).
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- DOI:
- Digital Object Identifier (open in new tab) 10.15199/48.2016.11.06
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- Category:
- Articles
- Type:
- artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
- Published in:
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Przegląd Elektrotechniczny
pages 23 - 26,
ISSN: 0033-2097 - Language:
- English
- Publication year:
- 2016
- Bibliographic description:
- Czaja Z., Bartosiński B.: A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus// Przegląd Elektrotechniczny. -., nr. 11 (2016), s.23-26
- DOI:
- Digital Object Identifier (open in new tab) 10.15199/48.2016.11.06
- Verified by:
- Gdańsk University of Technology
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