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Abstract
Previous works have proved that higher harmonics topography imaging using atomic force microscope (AFM) can significantly enhanced its measurement capabilities. Integrated tools dedicated to most of microscopes allow to visualize the investigated surface only by one selected harmonic. Because of the different characteristics of a sample, scanning tip and the environment, appropriate harmonic selection is time consuming and requires multiple scanning. In addition, repeated scanning guarantees no precise location of topographic formations, because the sample may be displaced. The author developed a system that allows simultaneous recording of the excitation signal, tips response signal from the photodiode and synchronization signal during typical surface scanning. The author presents an algorithm that allows higher harmonics surface imaging using these stored data
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- Category:
- Articles
- Type:
- artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
- Published in:
-
Zeszyty Naukowe Wydziału Elektrotechniki i Automatyki Politechniki Gdańskiej
no. 34,
pages 9 - 12,
ISSN: 1425-5766 - Language:
- English
- Publication year:
- 2013
- Bibliographic description:
- Babicz-Kiewlicz S.: Atomic Force Microscope data post-processing algorithm for higher harmonics imaging// Zeszyty Naukowe Wydziału Elektrotechniki i Automatyki Politechniki Gdańskiej. -Vol. 34., (2013), s.9-12
- Verified by:
- Gdańsk University of Technology
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