Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode
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- Category:
- Magazine publication
- Type:
- Magazine publication
- Published in:
-
MICROSCOPY AND MICROANALYSIS
no. 20,
edition 03,
pages 974 - 981,
ISSN: 1431-9276 - ISSN:
- 1431-9276
- Publication year:
- 2014
- DOI:
- Digital Object Identifier (open in new tab) 10.1017/s1431927614000531
- Verified by:
- No verification
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