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Abstract
We present results of the probability distribution analysis of flicker noise generated in Au nanoparticle (AuNP) decorated graphene–Si Schottky barrier diodes with and without yellow light illumination (592 nm), close to the localized surface plasmon resonance in the AuNPs (586 nm). The AuNPs occupy imperfections in the single-layer graphene and reduce the flicker noise intensity generated in the graphene layer. The estimated probability distribution exhibited an asymmetry shift when the sample was irradiated by yellow light (a 10-fold increase of the skewness coefficient). This effect is attributed to AuNPs collecting low-frequency fluctuations in the graphene layer and reducing 1/f noise.
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Authors (7)
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Lars Österlund
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Tesfalem Welearegay
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Adil Rehman
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Sergey Rumyantsev
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Details
- Category:
- Conference activity
- Type:
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Language:
- English
- Publication year:
- 2023
- Bibliographic description:
- Smulko J., Kwiatkowski A., Drozdowska K., Österlund L., Welearegay T., Rehman A., Rumyantsev S.: Probability distribution of flicker noise in AuNPdecorated graphene–Si Schottky barrier diode// / : , 2023,
- DOI:
- Digital Object Identifier (open in new tab) 10.1109/icnf57520.2023.10472774
- Sources of funding:
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- "System of gas detection by two-dimensional materials (grant no. 2019/35/B/ST7/02370), EU Horizon 2020 project VOGAS (grant no. 824986), H2020-MSCA-RISE project "CanLeish" (grant no. 101007653).
- Verified by:
- Gdańsk University of Technology
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