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Small signal admittance spectroscopy applied for extraction of charge carrier mobility in thin organic layers
Abstract
Praca przedstawia nowy sposób wyznaczania ruchliwości nośników ładunku w cienkich warstwach organicznych w oparciu o pomiary widm małosygnałowej admitancji.
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- DOI:
- Digital Object Identifier (open in new tab) 10.2478/s11772-011-0044-0
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
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OPTO-ELECTRONICS REVIEW
no. 19,
pages 474 - 477,
ISSN: 1230-3402 - Language:
- English
- Publication year:
- 2011
- Bibliographic description:
- Jarosz G., Signerski R.: Small signal admittance spectroscopy applied for extraction of charge carrier mobility in thin organic layers// OPTO-ELECTRONICS REVIEW. -Vol. 19, nr. Iss. 4 (2011), s.474-477
- DOI:
- Digital Object Identifier (open in new tab) 10.2478/s11772-011-0044-0
- Verified by:
- Gdańsk University of Technology
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