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Spectral reflectance modeling of ZnO layers made with Atomic Layer Deposition for application in optical fiber Fabry-Perot interferometric sensors
Abstract
Suitability of zinc oxide (ZnO) layers grown using Atomic Layer Deposition for operation in optical-fiber extrinsic Fabry-Perot sensors is investigated using a numerical model. Reflectance spectra obtained using the developed model indicate that the application of these layers in optical-fiber extrinsic Fabry-Perot sensors is difficult as it may require a source whose spectrum width is about 300 nm. A series of ZnO layers grown on end faces of SMF-28 fiber were prepared and their reflectance spectra were recorded by an optical spectrum analyser in order to verify the modelling results. The spectra contain a series of peaks not predicted by the model, which is attributed to two-mode propagation in the SMF-28 fiber connecting the ZnO layer with the rest of the measurement system.
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- Category:
- Conference activity
- Type:
- materiały konferencyjne indeksowane w Web of Science
- Title of issue:
- 2nd International Symposium on Optics and Biophotonics / Saratov Fall Meeting (SFM) strony 1 - 2
- Language:
- English
- Publication year:
- 2015
- Bibliographic description:
- Wierzba P., Jędrzejewska-Szczerska M..: Spectral reflectance modeling of ZnO layers made with Atomic Layer Deposition for application in optical fiber Fabry-Perot interferometric sensors, W: 2nd International Symposium on Optics and Biophotonics / Saratov Fall Meeting (SFM), 2015, SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA,.
- DOI:
- Digital Object Identifier (open in new tab) 10.1117/12.2179963
- Verified by:
- Gdańsk University of Technology
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