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Tailoring optical constants of few-layer black phosphorus coatings: Spectroscopic ellipsometry approach supported by ab-initio simulation
Abstract
2D black phosphorus (BP) has attracted extensive attention as an anisotropic platform for novel optoelectronic and polarizing optics applications. Insight into the factors that tune the optical and polarizing properties of 2D BP reveals their essential influence on BP-based photonic and optoelectronic devices. In this work, studies of the optical constants of few-layer black phosphorus coatings are studied and discussed, with particular emphasis on the complex dielectric function. Herein, the complex optical constants of multi-flake composite films in the energy range of 1.38–6.2 eV by spectroscopic ellipsometry with the use of the classical optical model have been determined. Classical optical simulations were supplied by dielectric function estimations delivered by density functional theory. Additionally, few-layer black phosphorus coatings were imaged by polarizing microscopy and investigated by Raman spectroscopy, revealing a size-tunable flake composition. The pattern analysis of the polarization images reveals a shift in polarization anisotropy originated mainly from the central region of the flake. The semi-isotropic optical properties suggest that the extinction coefficient of BP flakes defines the applications of BP in photonics, waveguides, and directional optoelectronic devices.
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Authors (7)
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Mirosław Sawczak dr hab. inż.
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Łukasz Skowroński
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Full text
- Publication version
- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.1016/j.jiec.2023.07.043
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Details
- Category:
- Articles
- Type:
- artykuły w czasopismach
- Published in:
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JOURNAL OF INDUSTRIAL AND ENGINEERING CHEMISTRY
no. 127,
pages 579 - 589,
ISSN: 1226-086X - Language:
- English
- Publication year:
- 2023
- Bibliographic description:
- Wieloszyńska A., Pyrchla K., Jakóbczyk P., Lentka D., Sawczak M., Skowroński Ł., Bogdanowicz R.: Tailoring optical constants of few-layer black phosphorus coatings: Spectroscopic ellipsometry approach supported by ab-initio simulation// JOURNAL OF INDUSTRIAL AND ENGINEERING CHEMISTRY -Vol. 127, (2023), s.579-589
- DOI:
- Digital Object Identifier (open in new tab) 10.1016/j.jiec.2023.07.043
- Sources of funding:
-
- Statutory activity/subsidy
- Verified by:
- Gdańsk University of Technology
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