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Search results for: CONVOLUTION

  • Colvolutional calibration of AFM probe

    Open Research Data
    open access - series: Scanning Probe Microscopies data

    Atomic force microscopy is based on the interaction of the examined surface with a probe of a pyramidal shape, tipped with a sharp end with a radius of curvature ranging from single nanometers to hundreds of nanometers. The resolution of the obtained image is of course dependent on the above-mentioned geometric size, and the resulting image is a convolutional...