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Search results for: COP
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XPS study of the lithium titanate doped by copper
Open Research DataLithium titanate doped by copper was measured by X-ray photoemission spectroscopy. For sol-gel synthesis lithium acetate dehydrate from Alfa Aesar GmbH &Co and titanium (IV) butoxide 97% from Aldrich were used as reagents. Copper (II) nitrate from Alfa Aesar was used as a source of Cu dopant. It was added in the proper weight to get an x index equal...
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Impedance spectroscopy of the lithium titanate doped by copper thin films
Open Research DataLithium titanate doped by copper thin films were derived by sol-gel method. Prepared gel was deposited by spin-coating technique. Samples with various content of Cu were measured by impedance spectroscopy method in a wide range of temperature, from -120 up to 150 deg.
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The scanning electron microscopy (SEM) studies of low voltage copper cables
Open Research DataThe dataset contains the scanning electron microscopy (SEM) images of the low voltage copper cables, which were studied in the article discussing the regulatory requirements for checking the electrical resistance of such cables. The cables were cut and studies in cross-section. The full results were published in:
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The SEM micrographs of the cavitation erosion-corrosion process of selected copper alloys degradation
Open Research DataThe dataset contains Scanning Electron Micrographs of CuZn40Mn3Fe brass compared with Superston and Novoston bronze after cavitation erosion-corrosion exposure using a vibratory transducer (in accordance with ASTM G32). The micrographs compare the topography of samples subjected cavitation erosion in 3% NaCl at room temperature, leading to the surface...
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Atomic force microscopy images of copper electrical contacts wear under the influence of friction
Open Research DataMeasurement of wear of copper electrical contacts under the influence of friction. Imaging in contact mode in the variant of scanning spreading resistance microscopy. Additionally, there are spectroscopic current-voltage curves showing local changes in electrical conductivity. NTEGRA Prima (NT-MDT) device. Probe NSG 01Pt.