Search results for: NANOIMPEDANCE MICROSCOPY

• Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact

  Publication

  • M. Tobiszewski
  • A. Zieliński
  • K. Darowicki

  - MICROSCOPY AND MICROANALYSIS - Year 2014

  Nanoimpedance measurements, using the dynamic impedance spectroscopy technique, were carried out during loading and unloading force of a probe on three kinds of materials of different resistivity. These materials were: gold, boron-doped diamond, and AISI 304 stainless steel. Changes of impedance spectra versus applied force were registered and differences in the tip-to-sample contact character on each material were revealed. To...

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• Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode.

  Publication

  • A. Zieliński
  • K. Darowicki

  - MICROSCOPY AND MICROANALYSIS - Year 2014

  This study presents a novel approach to impedance measurements. The methodology discussed is limited to contact in the sample-probe system under ambient conditions without the presence of electrolyte. Comparison with results of direct and alternating current measurements for well-defined metallic surfaces are made. In spite of idealization related to the type of contact examined, the proposed technique provides an improvement of...

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