The AFM micrographs of vanadium oxides thin films obtained at 400°C - Open Research Data - Bridge of Knowledge

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The AFM micrographs of vanadium oxides thin films obtained at 400°C

Description

The DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method.  The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared films at 400°C  under synthetic air. 

A Nanosurf Easyscan 2 AFM atomic force microscopy was used to examine the morphology of thin films.

Dataset file

400C.zip
2.6 MB, S3 ETag 275d1d9d43cf03afb6685ba6a5ca88a4-1, downloads: 43
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download file 400C.zip

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2021
Verification date:
2021-06-22
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/tjsw-v069 open in new tab
Series:
Verified by:
Gdańsk University of Technology

Keywords

References

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