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The influence of thermal conditions on V2O5 nanostructures prepared by sol-gel method

Abstract

This work presents the result of structure investigations ofV 2O5 nanorods grown from thin films and powders prepared by sol-gel method. To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100∘C to 600∘C. The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), and mass spectroscopy (MS). The rod-like structure of V2O5 was obtained at 600∘C on both quartz glass and silicon substrates and also from the bulk xerogel. The growth process and the effect of annealing treatment on the nanostructure are briefly discussed.

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Category:
Articles
Type:
artykuł w czasopiśmie wyróżnionym w JCR
Published in:
Journal of Nanomaterials no. 2015, pages 1 - 8,
ISSN: 1687-4110
Language:
English
Publication year:
2015
Bibliographic description:
Prześniak-Welenc M., Łapiński M. S., Lewandowski T., Kościelska B., Wicikowski L., Sadowski W.: The influence of thermal conditions on V2O5 nanostructures prepared by sol-gel method// Journal of Nanomaterials. -Vol. 2015, (2015), s.1-8
DOI:
Digital Object Identifier (open in new tab) 10.1155/2015/418024
Verified by:
Gdańsk University of Technology

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