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Abstract
Test suites for embedded systems are typically created from scratch using dif- ferent, often inadequate methods. In consequence, industry branches dealing with software-intensive embedded systems have to cope with quality problems, even though test processes are particularly time-consuming and costly. Based on an evolving model-based testing methodology we introduce test design patterns for simplifying and accelerating the test specification process. Making use of patterns, complex test objectives are covered with lower effort and test cases contain fewer design errors.
Authors (4)
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Abel Marrero Perez
- Technische Universität Berlin ..
-
Ina Schieferdecker
- Technische Universität Berlin ..
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Zhen Ru Dai
- Technische Universität Berlin ..
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Details
- Category:
- Conference activity
- Type:
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Title of issue:
- Proceedings of the 10th International Conference on Quality Engineering in Software Technology strony 1 - 16
- Language:
- English
- Publication year:
- 2007
- Bibliographic description:
- Zander J., Perez A., Schieferdecker I., Dai Z.: Test Design Patterns for Embedded Systems,// Proceedings of the 10th International Conference on Quality Engineering in Software Technology/ Berlin: , 2007, s.1-16
- Verified by:
- Gdańsk University of Technology
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