Quality of Test Specification by Application of Patterns

Justyna Zander

doi:10.1145/1753196.1753200

Quality of Test Specification by Application of Patterns

Abstract

Embedded system and software testing requires sophisticated methods, which are nowadays frequently supported by application of test patterns. This eases the test development process and contributes to the reusability and maintainability of the test specification. However, it does not guarantee the proper level of quality and test coverage in d ifferent dimensions of the test specification. In this paper the quality of the test is investigated and numerous metrics are defined. They are based mainly on the applied test patterns. They give a measure of quality for the test design and executed test cases w.r.t. a number of aspects. They also evidence the value of patterns application. If weighted, they enable to assess the executed tests.

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Justyna Zander dr inż.

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Details

Category:: Conference activity
Type:: publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
Title of issue:: International Conference on Object-Oriented Programming, Systems, Languages, and Applications (OOPSLA 2008)
Language:: English
Publication year:: 2008
Bibliographic description:: Zander J.: Quality of Test Specification by Application of Patterns// International Conference on Object-Oriented Programming, Systems, Languages, and Applications (OOPSLA 2008)/ New York, NY: , 2008,
DOI:: Digital Object Identifier (open in new tab) 10.1145/1753196.1753200
Verified by:: Gdańsk University of Technology