SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 1000°C dependent on film thickness - Open Research Data - Bridge of Knowledge

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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 1000°C dependent on film thickness

Description

The DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (2-3 AsP layers) were deposited on a silicon substrate and were annealing at  1000°C  under an argon atmosphere. 

The surface morphologies of the samples were studied by an FEI Company Quanta FEG 250 scanning electron microscope (SEM) (Waltham, MA, USA),  mounting the analyzed sample on a carbon conductive tape. 

Dataset file

Argon 1000 diff film thickness.zip
47.7 MB, S3 ETag fbd8432686684d72fdb5c77d046e9904-1, downloads: 62
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download file Argon 1000 diff film thickness.zip

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License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2021
Verification date:
2021-07-13
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/7dwj-wk25 open in new tab
Series:
Verified by:
Gdańsk University of Technology

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