SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 500°C

Description

The DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon atmosphere.

The surface morphologies of the samples were studied by an FEI Company Quanta FEG 250 scanning electron microscope (SEM) (Waltham, MA, USA), mounting the analyzed sample on a carbon conductive tape.

Dataset file

Ar500.zip

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Raw data:: Data contained in dataset was not processed.

Details

Year of publication:

2021

Verification date:

2021-07-13

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/4vg9-gw41

Series:

Vanadium oxides

Verified by:

Gdańsk University of Technology

Keywords

References

publication The influence of thermal conditions on V2O5 nanostructures prepared by sol-gel method

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