The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology - Open Research Data - Bridge of Knowledge

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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology

Description

The DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method.  The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were annealing at  300°C  under synthetic air. 

A Nanosurf Easyscan 2 AFM atomic force microscopy was used to examine the morphology of thin films.

Dataset file

Thickness quartz glass.zip
17.2 MB, S3 ETag bbf5636befef35bd7e0e3388436902ea-1, downloads: 4
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download file Thickness quartz glass.zip

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2021
Verification date:
2021-06-22
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/55ed-3h95 open in new tab
Series:
Verified by:
Gdańsk University of Technology

Keywords

References

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