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A method of self-testing of an analog circuit terminated by an ADC in electronic embedded systems controlled by microcontrollers
Abstract
A new self-testing method of analog parts terminated by an ADC in electronic embedded systems controlled by microcontrollers is presented. It is based on a new fault diagnosis method based on on-line (i.e. during measurement), transformations of voltage samples of the time response of a tested part to a square pulse - onto localization curves placed in the measurement space. The method can be used for fault detection and single soft fault localization.
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- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.15199/48.2016.11.05
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- Category:
- Articles
- Type:
- artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
- Published in:
-
Przegląd Elektrotechniczny
pages 19 - 22,
ISSN: 0033-2097 - Language:
- English
- Publication year:
- 2016
- Bibliographic description:
- Czaja Z.: A method of self-testing of an analog circuit terminated by an ADC in electronic embedded systems controlled by microcontrollers// Przegląd Elektrotechniczny. -., nr. 11 (2016), s.19-22
- DOI:
- Digital Object Identifier (open in new tab) 10.15199/48.2016.11.05
- Verified by:
- Gdańsk University of Technology
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