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Immunity of residual current devices to the impulse leakage current in circuits with variable speed drives
Abstract
This paper concerns reliability of supply in variable speed drive circuits with residual current devices. During normal operation of these circuits high value of leakage current causes unwanted tripping of residual current devices. Immunity of residual current devices to the impulse leakage current should be evaluated. The system for testing of residual current devices and results of the test are presented
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- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.5755/j01.eee.19.8.2883
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
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Elektronika Ir Elektrotechnika
no. 19,
pages 15 - 18,
ISSN: 1392-1215 - Language:
- English
- Publication year:
- 2013
- Bibliographic description:
- Czapp S., Borowski K.: Immunity of residual current devices to the impulse leakage current in circuits with variable speed drives// Elektronika Ir Elektrotechnika. -Vol. 19, nr. 8 (2013), s.15-18
- DOI:
- Digital Object Identifier (open in new tab) 10.5755/j01.eee.19.8.2883
- Verified by:
- Gdańsk University of Technology
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