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Search results for: UHV
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Chemical composition analysis of the LSNO ceramics
Open Research DataThe chemical composition of a series of La-Sb-Nb-O ceramics manufactured by the solid-phase reaction method was analyzed. The samples with a various antimony content were measured by XPS method (OmicronNanotechnology UHV system). Analysis confirmed presence of elements: La, Sb, Nb.
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XPS analysis of strontium titanate ceramics
Open Research DataThe chemical composition of the strontium titanite doped with yttrium and iron ceramic samples was investigated. Samples of Y0.07Sr0.93Ti0.8Fe0.2 were prepared by solid phase reaction and sintered for 24 and 48 hours. Chemical composition was measured by UHV OmicronNanotechnology XPS system. The analysis confirmed the chemical composition of the ceramics...
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Polymers doped by Ca or P. Chemical composition investigations
Open Research DataThe calcium and phosphorus doped polyurethane polymers (PU) were analyzed by XPS method. A series of samples with various content of Ca and P dopand - from 0% up to 21%) were selected for measutements. The chemical composition and valence state of elements were measurements using OmicronNatechnology UHV system wih Argus hemispherical photoelectron...
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SPTNO ceramics measured by XPS method
Open Research DataSPTNO (Sr-Pr-Ti-Ni-O) ceramic were manufactured by solid state reaction, from oxides compounds. Synthesis conducted in air atmosphere at temperature in a range of 800-900 deg. Chemical composition of prepared materials were measured by XPS (X-Ray photoemision spectroscopy) method. UHV OmicronNanotechnology system with 128 channel Argus hemispherical...
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XPS study of the TiO2-WO2 composites
Open Research DataValence state of W and Ti was measured in a TiO2-WO3 composites with a various composition.Powder samples of pure titanium dioxide, tungsten oxide and mix of 50% titanium oxide and 50% od tungsten oxide were measured. Oxides were annealed at the temperature in the range of 300 Celsius degree up to 900 deg. Measurements were performed by XPS UHV Omicron...
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XPS investigations of tge tin/tin oxides - CNT composites
Open Research DataThe composite of tin/tin oxide nanoparticles with graphene oxide and CMC based on laser ablation technique as an electrode material for energy storage devices were manufactured. The material exhibited a three-dimensional conducting graphene oxide network decorated with tin or tin oxide nanoparticles. The presence of tin/tin oxide in composites was...
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Depth profile of the gold-silver bimetallic structures
Open Research DataSilver and gold bimetallic layers were deposited on a silicon substrate by magnetron sputtering method. Both, Au and Ag layers had 3 nm of thickness. That prepared nanostructures were measured by XPS method. To obtain a depth profile of chemical composition, an Argon ion (Ar+) gun was used for etching surface of sample. Each cycle of etching takes 30...
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The XAS spectra of O-K edges, Fe-L edges in pristine, La-, and Nb-doped SFM in 3 states: as-prepared, reduced and reoxidized
Open Research DataThis dataset contains the normalized and exported to *.txt spectra for x-ray absorption spectroscopy. The samples analyzed were strontium ferrite molybdate based, doped with lanthanum and niobium. The powders were measured in as-prepared state (denoted in filename as AP), reduced (red) and reoxidized (reox). The filenames are written accordingly: Edge_(optional:...
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Depth profile of the chemical composition of the Au-Ag multilayers
Open Research DataSilver and gold multilayers were deposited on a silicon substrate by magnetron sputtering method. Both type, Au and Ag thin films had 2 nm of thickness. Totally structure had thickness of 6 nm (Au-Ag-Au). That prepared multilayers were measured by XPS method. To obtain a depth profile of chemical composition, an Argon ion (Ar+) gun was used for etching...
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XPS analysis of the GO based materials
Open Research DataGraphene oxides samples were measured by XPS method. The X-ray photoemission spectroscopy measurements were carried out with Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The photoelectrons...
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Graphene oxide thin films deposited on a PCB board - chemical analysis
Open Research DataGraphene oxides based films were measured by X-ray photoemission spectroscopy (XPS) method. TheXPS measurements were carried out with the Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The...
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XPS analysis of TBBO glass
Open Research DataGlasses and glass-ceramics with nominal composition 73 TeO2– 4BaO– 3Bi2O3–18SrF2-2RE2O3 (where RE = Eu, Dy) have been synthesized by conventional melt-quenching technique and subsequent heat treatment at 370 °C for 24 h in air atmosphere. Various Eu3+ to Dy3+ molar ratio have been applied to investigate luminescence properties in both glass and glass-ceramic...