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Search results for: cables
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The scanning electron microscopy (SEM) studies of low voltage copper cables
Open Research DataThe dataset contains the scanning electron microscopy (SEM) images of the low voltage copper cables, which were studied in the article discussing the regulatory requirements for checking the electrical resistance of such cables. The cables were cut and studies in cross-section. The full results were published in:
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The conducted immunity test of a power supply unit in accordance with EMC standards
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 150 kHz to 230 MHz are...
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The conducted immunity test of an AC adaptor in accordance with EMC standards
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the ac adaptor PHILIPS DC power supply SBC 6654. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 150 kHz...
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Place attachment, place identity, and visual pollution sensitivity.
Open Research DataThe data include individual responses on the following scales (1) place attachment, (2) place identity, and (3) visual pollution sensitivity. Each line represents responses obtained from one participant and his or her demographic characteristics. like gender, age, and education level.
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 3 V
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 1 V
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 10 V
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...
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Experimental Study of the Influence of Noise Level on the Uncertainty Value in a Measurement System Containing an Analog-to-Digital Converter
Open Research DataFor newly developed measuring systems it is easy to estimate type B uncertainties based on the technical data of the measuring modules applied. However, it is difficult to estimate A type un-certainties due to the unknown type and level of interferences infiltrating into the measuring sys-tem. This is a particularly important problem for measurements...