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The AFM micrographs of gold nanoparticles on silicon substrate
Open Research DataThe dataset contains the first approach towards AFM topographic imaging of gold nanoparticles synthesized and immobilized on the silicon surface. Measurements were made in the semi-contact mode on the NTEGRA Prima device, manufactured by NT-MDT. Scans were performed with amplitude detection at an operating value of 60% of the free oscillation amplitude....
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Colvolutional calibration of AFM probe
Open Research DataAtomic force microscopy is based on the interaction of the examined surface with a probe of a pyramidal shape, tipped with a sharp end with a radius of curvature ranging from single nanometers to hundreds of nanometers. The resolution of the obtained image is of course dependent on the above-mentioned geometric size, and the resulting image is a convolutional...
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Statistics of AFM current-voltage curves
Open Research DataMapping surface electrical conductivity offers enormous cognitive possibilities regarding the structure and properties of modern materials. The technique invented for this purpose (Conductive AFM) by Murrel's team and colleagues allows independent monitoring of the local conductivity of materials in correlation with the topographic profile. The mentioned...