Search results for: OPTOELECTRONICS
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Sylwia Babicz-Kiewlicz dr inż.
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Michał Rycewicz dr inż.
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Katarzyna Drozdowska mgr inż.
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Dariusz Palmowski mgr inż.
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Maciej Jerzy Głowacki
PeopleMaciej Jerzy Głowacki is an alumnus of the Gdańsk University of Technology. He graduated with honors from the Faculty of Mechanical Engineering (B.Eng., 2017) and the Faculty of Electronics, Telecommunications and Informatics (M.S., 2018). Since 2014 he has been continuously actively involved in a research carried out at the Department of Metrology and Optoelectronics. His scientific activities include a deposition of antibacterial...
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Tomasz Chludziński mgr inż.
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Agnieszka Tracz-Sagajdakow dr inż.
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Marek Sienkiewicz inż.
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Patryk Sokołowski mgr inż.
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Optoelectronic device for hematocrit measurements
PublicationAn optoelectronic system for measurements of hematocrit level (HCT) in the whole human blood is presented. Proposed system integrates a dedicated optoelectronic sensor, a microcontroller and a small LCD display in a low cost, battery-powered, handheld device. Chosen method for determining blood hematocrit level is based on optical properties of whole blood in visible and NIR wavelength range. Measurements with the use of proposed...
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Adam Władziński
PeopleAdam Władziński, a PhD Candidate at Gdansk University of Technology, specializes in Biomedical Engineering with a focus on machine learning for image processing and blockchain technology. Holding a BEng and MSc in Electronics, Adam Władziński has developed a keen interest in applying advanced computational techniques to biological systems. During their master’s program, Adam Władziński explored laser spectroscopy, building a database...
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Zespół Metrologii i Optoelektroniki
Research Teams* komputerowo wspomagana metrologia i diagnostyka * projektowanie systemów * mikrosystemów i makrosystemów elektronicznych * testowanie i diagnostyka elektroniczna * pomiary właściwości szumowych i zakłóceń * spektroskopia impedancyjna * telemetria i telediagnostyka internetowa * katedra redaguje Metrology and Measurement Systems * kwartalnik PAN znajdujący się na liście JCR