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wszystkich: 136
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Wyniki wyszukiwania dla: COMPUTER SIMULATIONS, CALCULUS OF PROBABILITY, MODELLING, SURVIVAL, PROBABILITY, RISK, FORECASTING, RELIABILITY
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The generalized Suzuki model of the multipath fading channel
Dane BadawczeThe dataset contains the results of simulations that are part of the research on modelling the multipath fading in the communication channel. The generalized Suzuki fading envelope is generated using the Monte-Carlo simulation (MCS) in the LabVIEW programming environment.
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The Rayleigh model of the multipath fading channel
Dane BadawczeThe dataset contains the results of simulations that are part of the research on modelling the multipath fading in the communication channel. The Rayleigh fading envelope is generated using the Monte-Carlo simulation (MCS) in the LabVIEW programming environment.
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The Weibull model of the multipath fading channel
Dane BadawczeThe dataset contains the results of simulations that are part of the research on modelling the multipath fading in the communication channel. The Weibull fading envelope is generated using the Monte-Carlo simulation (MCS) in the LabVIEW programming environment.
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The α-µ model of the multipath fading channel
Dane BadawczeThe dataset contains the results of simulations that are part of the research on modelling the multipath fading in the communication channel. The envelope of the α-µ fading process is generated using the Monte-Carlo simulation (MCS) in the LabVIEW programming environment.
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The Suzuki model of the multipath fading channel
Dane BadawczeThe dataset contains the results of simulations that are part of the research on modelling the multipath fading in the communication channel. The Suzuki fading envelope is generated using the Monte-Carlo simulation (MCS) in the LabVIEW programming environment.
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The lognormal model of the multipath fading channel
Dane BadawczeThe dataset contains the results of simulations that are part of the research on modelling the multipath fading in the communication channel. The lognormal fading envelope is generated using the Monte-Carlo simulation (MCS) in the LabVIEW programming environment.
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Reliability data safety instrumented systems SIS from the functional safety analysis example critical instalation
Dane BadawczeThe dataset represents the results of an example of functional safety analysis systems is presented below. It is based on a control system, which consists of some basic components like sensors, programmable logic controllers and valves. It is a part of petrochemical critical installations. The communication between sensor logic controllers and actuators...
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A cumulative probability function of instantaneous flicker sensation values measured in the industrial power system supplying the rolling mill motors
Dane BadawczeThe dataset presents a cumulative probability function CPF of the instantaneous flicker sensation level measured on the bus bars of the main switchgear of the industrial power network for the supply of rolling mills. The data were obtained during an experiment whose purpose was to determine a level of short-term and long-term flicker caused by voltage...
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The short-term flicker severity level measured in the industrial power system supplying the rolling mill motors
Dane BadawczeThe dataset presents a short-term flicker severity level measured on the bus bars of the main switchgear of the industrial power network for the supply of rolling mills. The data were obtained during an experiment whose purpose was to determine a level of short-term and long-term flicker caused by voltage fluctuations. In the virtual application of...
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Experimental Study of the Influence of Noise Level on the Uncertainty Value in a Measurement System Containing an Analog-to-Digital Converter
Dane BadawczeFor newly developed measuring systems it is easy to estimate type B uncertainties based on the technical data of the measuring modules applied. However, it is difficult to estimate A type un-certainties due to the unknown type and level of interferences infiltrating into the measuring sys-tem. This is a particularly important problem for measurements...