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Wyniki wyszukiwania dla: XRD pattern
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The XRD pattern of CeO2/10wt.%Ni with BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Ni. The samples of nanoCeO2 were impregnated with BCD-assisted precursor nitrate solution (betacyclodextrin). The dataset includes 5-90 2 theta degree measurement. Nonreduced. Sintered at 400oC for 4h.
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The XRD pattern of CeO2/10wt.%Co prepared with BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Co. The samples of nanoCeO2 were impregnated with BCD-assisted precursor solution (betacyclodextrin). The dataset includes the 5-90 2theta degree measurement.
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The XRD pattern of CeO2/10wt.%Ni prepared with BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Ni. The samples of nanoCeO2 were impregnated with BCD-assisted precursor solution (betacyclodextrin). The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4h in air.
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The XRD pattern of CeO2/10wt.%Mn prepared with BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Mn. The samples of nanoCeO2 were impregnated with BCD-assisted precursor solution (betacyclodextrin). The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4 h in air.
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The XRD pattern of CeO2/10wt.%Fe prepared with BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Fe. The samples of nanoCeO2 were impregnated with BCD-assisted precursor solution (betacyclodextrin). The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4 h in air.
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The XRD pattern of CeO2/10wt.%Cu prepared with BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Cu. The samples of nanoCeO2 were impregnated with BCD-assisted precursor solution (betacyclodextrin). The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4 h in air.
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The XRD pattern of CeO2/10wt.%Cu prepared without BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Cu. The samples of nanoCeO2 were impregnated without BCD-assisted precursor solution (betacyclodextrin) - pure nitarte solution 1M. The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4 h in air.
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The XRD pattern of CeO2/10wt.%Fe prepared without BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Fe. The samples of nanoCeO2 were impregnated without BCD-assisted precursor solution (betacyclodextrin) - pure nitarte solution 1M. The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4 h in air.
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The XRD pattern of CeO2/10wt.%Mn prepared without BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Mn. The samples of nanoCeO2 were impregnated without BCD-assisted precursor solution (betacyclodextrin) - pure nitarte solution 1M. The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4 h in air.
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The XRD pattern of CeO2/10wt.%Co prepared without BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Co. The samples of nanoCeO2 were impregnated without BCD-assisted precursor solution (betacyclodextrin) - pure nitarte solution 1M. The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4 h in air.
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The XRD pattern of CeO2/10wt.%Ni prepared without BCD
Dane BadawczeThe dataset includes the XRD pattern of CeO2/10wt.%Ni. The samples of nanoCeO2 were impregnated without BCD-assisted precursor solution (betacyclodextrin) - pure nitarte solution 1M. The dataset includes the 5-90 2theta degree measurement. Nonreduced. Sintered at 400oC for 4 h in air.
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XRD pattern of Mo2Ga2C, Mo2CTx/Mo2GaC and Ni-Mo2CTx/Mo2Ga2C materials
Dane BadawczeIn the dataset are included raw data for the preparation of XRD pattern of Mo2Ga2C, Mo2CTx/Mo2GaC and Ni-Mo2CTx/Mo2Ga2C materials.
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The XRD diffraction pattern of interdiffusion test in the CLO-NiO-YSZ system (30wt.%YSZ)
Dane BadawczeThe dataset includes the XRD pure diffraction pattern of the interdiffusion system consisting of CLO (Ce0.8La0.2O2), NiO and 8YSZ (8mol.% Y2O3 stabilized ZrO2). The mixture contains equal amounts of CLO and NiO as well as 30wt.% 8YSZ. Samples were sintered at 1400 oC. The reaction between CLO and YSZ is visible.
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The XRD diffraction pattern of interdiffusion test in the CLO-NiO-YSZ system (10wt.%YSZ)
Dane BadawczeThe dataset includes the XRD pure diffraction pattern of the interdiffusion system consisting of CLO (Ce0.8La0.2O2), NiO and 8YSZ (8mol.% Y2O3 stabilized ZrO2). The mixture contains equal amounts of CLO and NiO as well as 10wt.% 8YSZ. Samples were sintered at 1400 oC. The reaction between CLO and YSZ is visible.
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The XRD diffraction pattern of interdiffusion test in the CLO-NiO-YSZ system (20wt.%YSZ)
Dane BadawczeThe dataset includes the XRD pure diffraction pattern of the interdiffusion system consisting of CLO (Ce0.8La0.2O2), NiO and 8YSZ (8mol.% Y2O3 stabilized ZrO2). The mixture contains equal amounts of CLO and NiO as well as 20wt.% 8YSZ. Samples were sintered at 1400 oC. The reaction between CLO and YSZ is visible.
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XRD patterns of nickel-modified V2CTx
Dane BadawczeThe set includes data for XRD pattern preparation of nickel-modified V2CTx samples.
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XRD patterns of MXenes catalysts
Dane BadawczeData contain results from XRD measurements of the Ti3C2Tx MXenes produced via acidic etching aluminum from MAX Phase (Ti3C2-Al-Ti3C2-Al-Ti3C2) using different etching agents, HF/HCl and HF/H2SO4 with different weight ratios (1:3, 1:4, and 1:5). The samples were labeled as MXene HF/HCl X:Y and MXene HF/H2SO4 X:Y, where X:Y means the acids weight ratios....
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XRD patterns of V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of V2O5 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of TeOx powder
Dane BadawczeThe DataSet contains the XRD patterns of the TeOx powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. The sol was obtained by vigorously stirring precursor solution at 50°C for 2h, then the temperature was raised to 75°C for the...
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XRD patterns of ammonium vanadate nanocrystals
Dane BadawczeThe DataSet contains the XRD patterns of ammonium vanadate nanobelts obtained by the hydrothermal method with different conditions. The results show that the structure and phase compositions of samples dependent on reaction conditions.
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XRD patterns of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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XRD patterns of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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XRD patterns of TeOx-BaO-BiO powder
Dane BadawczeThe DataSet contains the XRD patterns of the TeOx-BaO-BiO powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor), barium carbonate, and bismuth carbonate with thetraetylene glycol, water, ethanol, and acetic acid. (Samples molar concentration: 73TeO2-4BaO-3Bi2O3 and 73TeO2-3BaO-4Bi2O3)....
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XRD patterns of MXenes ashes obtained after TGA measurement
Dane BadawczeData contain results from XRD measurements of the product (ashes) produced after TGA of MAX Phase, MXene HF, MXene HF/HCl 1:3 and MXene HF/H2SO4 1:3 . The measurements were performed in AERIS PANalytical X-ray diffractometer with Cu-Ka radiation.
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XRD patterns of V2O5 thin films deposited on silicon substrate
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on quartz glass
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XRD patterns of VO2 and V2O3 thin films obtained at 500°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon atmosphere.
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XRD patterns of VO2 and V2O3 thin films obtained at 700°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C, 600C, and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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X-ray Diffraction (XRD) patterns of PC-X (porous carbon materials obtained at various temperatures)
Dane BadawczeThese data contain X-ray diffraction patterns (XRD) of PC-700 (porous carbon materials obtained at 700°C), PC-800 (porous carbon materials obtained at 800°C) and PC-900 (porous carbon materials obtained at 900°C).
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X-ray diffraction (XRD) patterns of nickel(II) oxide (NiO) functionalized borophene and bulk boron
Dane BadawczeThese data include X-ray diffration (XRD) patterns of nickel(II) oxide (NiO) functionalized borophene before and after oxygen evolution reaction (OER), bulk boron (B), graphiic foil (GF) and nickel(II) oxide nanoparticles (NiO).
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The XRD diffraction patterns of annealed Ce0.9M0.1O2 powders prepared using the reverse microemulsion method
Dane BadawczeThe dataset includes XRD patterns of Ce0.9M0.1O2 (where M=Mn, Fe, Co, Ni, Cu) nanopowders prepared using the reverse microemulsion method. The powders were precipitated from organic-based solution of nitrates using TMAOH. The sediment was cetrifuged and rinsed with alcohol several times. Powders were dried and calcinated at 500 degrees for 2 h, followed...
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Structural investigations of the LTO:Cu thin films
Dane BadawczeLithium titanate (Li1+xTi2-xO4) doped with Cu2+ ions was synthesized by sol-gel processing method. The structure was characterized by X-ray Diffraction (XRD). All samples revealed presence of LTO spinel phase. X-ray pattern of undoped LTO was free of any impurities and other crystal phases. Similarly, samples with low amount of copper dopant (x = 0.05...