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prof. dr hab. Ewa Iwona Mijowska
Employment
- at Faculty of Chemical Technology and Engineering
- at West Pomeranian University of Technology
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Electrochemical data for carbonized metal-organic framworks with cobalt
Open Research DataThe data includes the Metal-Organic Frameworks (MOF) measurements, where cobalt was added. The research focuses on the impact of aluminium on Oxygen Evolution Reaction (OER). The measurements were conducted on [EC Lab]. The techniques included are Linear Sweep Voltammetry (LSV), Tafel slope, Chronopotentiometry (CP) and Electrochemical Impedance Spectroscopy...
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Carbonized Metal-Organic Frameworks-based strucutres with aluminium, phosphorus and nitrogen
Open Research DataThe dataset includes Raman spectra of carbonized Metal-Organic Frameworks (MOF) [acquired on Renishaw] and electrochemical properties of the materials [acquired on EC Lab], which includes techniques such as Linear Sweep Voltammetry (LCV), Electrochemical Impedance Spectroscopy (EIS), Taffel slope and Chronopotentiometry (CP).
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Stability of borophene dispersion in water
Open Research DataThis dataset contains the results of the studies of stability of borophene dispersion in water (1 µg/µL) based on the measurements of absorbance of the solution using UV-VIS spectroscopy.
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X-ray diffraction (XRD) patterns of nickel(II) oxide (NiO) functionalized borophene and bulk boron
Open Research DataThese data include X-ray diffration (XRD) patterns of nickel(II) oxide (NiO) functionalized borophene before and after oxygen evolution reaction (OER), bulk boron (B), graphiic foil (GF) and nickel(II) oxide nanoparticles (NiO).
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X-ray photoelectron spectroscopy (XPS) results for nickel(II) oxide (NiO) functionalized borophene and boron
Open Research DataThis dataset contain X-ray photoelectron spectroscopy (XPS) results for nickel(II) oxide (NiO) functionalized borophene before and after oxygen evolution reacion (OER) nad bulk boron.
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AFM (atomic force microscopy) images of borophene flakes obtained during ball milling at different operating parameters
Open Research DataThis dataset contains atomic force microscopy (AFM) images of representative borophene flakes obtained during ball milling. The operational parameters of the ball-milling process included rotation speed (250, 450, and 650 rpm), time of ball-milling (1, 3, 6, and 12 h), and the mass loading of starting bulk boron (1, 2, 3 g).
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AFM (atomic force microscopy) images of borophene after sonication of boron
Open Research DataThese data include AFM (atomic force microscopy) images of borophene obtained after sonication in aceton of boron, collected in order to estimate lateral size of the nanoflakes.
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Electrochemical measurements of borophene functionalized with nickel(II) oxide (NiO)
Open Research DataThis dataset contains linear sweep voltammetry (LSV) and chronopotentiometry (CP) technique results for borophene functionalized with nickel(II) oxide (NiO) and reference samples: ruthenium(IV) oxide (RuO2), nickel(II) oxide (NiO) and pristine borophene. Linear sweep voltammetry (LSV) results show the oxygen evolution reaction permormance of the obtained...
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Fourier-transform infrared spectroscopy (FTIR) spectra of bulk boron and borophene flakes
Open Research DataThese data contain Fourier-transform infrared spectroscopy (FTIR) spectra of bulk boron and borophene flakes obtained during ball milling (450 rpm, 6 h, 1 g). Spectra were acquired to investigate the chemical bonds and functional groups on the surface of the pristine boron and borophene flakes.
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X-ray Photoelectron Spectroscopy (XPS) results of bulk boron and borophene after the ball-milling process
Open Research DataThese data contain X-ray Photoelectron Spectroscopy (XPS) results of boron and borophene nanoflakes induced during ball milling at rotation speed of 450 rpm, 6 h and mass loading of 1g.
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TEM (transmission electron microscopy) images and elemental mapping EDX (energy dispersive X-ray spectroscopy) of bulk boron and borophene obtained during ball milling
Open Research DataThese data contain TEM (transmission electron microscopy) images with corresponding elemental mapping EDX of bulk boron and borophene flakes after the ball-milling process (450 rpm, 6 h, 1 g). The data were collected to investigate the structure and morphology of the materials.
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X-ray diffraction (XRD) of bulk boron and borophene flakes after the ball-milling process at different operating parameters
Open Research DataThese data include X-ray diffraction patterns of bulk boron and borophene obtained during ball milling at different rotation speeds, time and mass loadings. The data were collected to investigate the crystal structure of the studied materials.
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Cyclic voltammograms of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide) and ex-WS2 (exfoliated tungsten disulfide)
Open Research DataThese data contain cyclic voltammograms of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide) and ex-WS2 (exfoliated tungsten disulfide). The data were collected for samples obtained from three ex-WS2:GO dispersions - with 1:1, 1:2, and 2:1 weight ratios.
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Galvanostatic cycling with potential limitation (GCPL) of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide) and ex-WS2 (exfoliated tungsten disulfide)
Open Research DataThese data contain results of galvanostatic cycling with potential limitation (GCPL) of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide) and ex-WS2 (exfoliated tungsten disulfide). The data were collected for samples obtained from three ex-WS2:GO dispersions - with 1:1, 1:2, and 2:1 weight ratios.
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XRD (X-ray diffraction) patterns of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide), ex-WS2 (exfoliated tungsten disulfide) and GO (graphene oxide)
Open Research DataThese data contain XRD (X-ray diffraction) patterns of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide), ex-WS2 (exfoliated tungsten disulfide) and GO (graphene oxide). The data were collected for samples obtained from three ex-WS2:GO dispersions - with 1:1, 1:2, and 2:1 weight ratios.
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XRD (X-ray diffraction) spectra of bulk boron and obtained borophene
Open Research DataThis dataset includes XRD (X-ray diffraction) spectra of bulk boron and borophene obtained during sonication process, giving the information on the phase composition and crystallinity of materials.
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Raman spectra of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide) and ex-WS2 (exfoliated tungsten disulfide)
Open Research DataThese data contain Raman spectra of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide) and ex-WS2 (exfoliated tungsten disulfide). The data were collected for samples obtained from three ex-WS2:GO dispersions - with 1:1, 1:2, and 2:1 weight ratios.
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Ni-based compounds in multiwalled graphitic shell for electrocatalytic oxygen evolution reactions
Open Research DataThis study investigates Ni-based compounds (Ni, NiO, Ni3C) coated with a graphitic shell as electrocatalysts for the oxygen evolution reaction (OER). Electron paramagnetic resonance (EPR) and X-ray diffraction (XRD) are employed to identify the presence and contribution of Nickel ions (Ni0, Ni2+, Ni3+) and determine the phase composition. Electrochemical...
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Transmission electron microscope (TEM) and optical microscope images of pristine and silica-coated bismuth oxide and gadolinium oxide particles
Open Research DataCollection of raw transmission electron microscope (TEM) micrographs and optical microscope images used in the associated manuscript. All data in accessible *.tif format. Zip package contains:
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BET specific surface area measurements of bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataThe BET specific surface area was measured using an N2 adsorption/desorption isotherm (Micromeritics ASAP 2460, Norcross, GA, USA).
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X-ray diffraction (XRD) of silica-coated bismuth oxide/gadolinium oxide (Bi2O3+Gd2O3) structures
Open Research DataData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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BET specific surface area measurements of silica-coated bismuth oxide (Bi2O3)/gadolinium oxide (Gd2O3) core-shell structures
Open Research DataThe BET specific surface area was measured using an N2 adsorption/desorption isotherm (Micromeritics ASAP 2460, Norcross, GA, USA).
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BET specific surface area measurements of silica-coated bismuth oxide(Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataThe BET specific surface area was measured using an N2 adsorption/desorption isotherm (Micromeritics ASAP 2460, Norcross, GA, USA).
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Raman spectroscopy analysis of synthesized sol-gel silica coatings
Open Research DataThese data contains Raman spectra of silica coatings synthesized using sol-gel method A and B, which were described with publication associated with this dataset. Raman scattering was measured with a Renishaw microRaman spectrometer (830 nm).
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TEM, EDS and optical microscope images of pristine and silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures.
Open Research DataData consists of raw TEM/EDS and optical microscope images of pristine and silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures. Additional TEM images and optical microscope images of silica shells were included.
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X-ray diffraction (XRD) of pristine bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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X-ray diffraction (XRD) of silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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