Year 2021

• Computer Support of Analysis of Optical Spectra Measurements

  Publication

  • S. Pawłowska

  - Engineering Proceedings - Year 2021

  The verification of measurement errors has a big impact on the assessment of the accuracy of conducted measurements and obtained results. In many cases, computer simulation results are compared with measurement results in order to evaluate measurement errors. The purpose of our research was to check the accuracy of measurements made with a Fabry–Perot interferometer working in the transmission mode. In the measurement setup, a...

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• Computer support of analysis optical spectra measurements

  Publication

  • S. Pawłowska
  • J. Gierowski

  - Year 2021

  Verification of measurement errors has a big impact on assessment of accuracy of conducted measurements and obtained results. In many cases computer simulation results are compared with measurement results in order to evaluate measurement errors. The purpose of our research was to check the accuracy of measurements made with Fabry-Perot interferometer working in the transmission mode. In measurement setup, a 1310 nm superluminescent...

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• Implementation of SiN thin film in fiber-optic sensor working in telecommunication range of wavelengths

  Publication

  • S. Pawłowska
  • J. Gierowski
  • B. Stonio
  • M. Juchniewicz
  • M. Ficek
  • M. Kruczkowski
  • M. Szczerska

  - Scientific Reports - Year 2021

  Mirrors are used in optical sensors and measurement setups. This creates a demand for mirrors made of new materials and having various properties tailored to specific applications. In this work, we propose silicon covered with a thin silicon nitride layer as a mirror for near-infrared measurements. SiN layer was deposited on a standard silicon wafer with a Low-Pressure Chemical Vapor Deposition furnace. Then, the created layer...

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• Incorporation of nitrogen in diamond films – A new way of tuning parameters for optical passive elements

  Publication

  • M. Kosowska
  • S. Pawłowska
  • K. J. Sankaran
  • D. Majchrowicz
  • K. Haenen
  • K. Dholakia
  • M. Szczerska

  - DIAMOND AND RELATED MATERIALS - Year 2021

  This paper investigates the impact of nitrogen incorporation in diamond films for the construction of an interferometric sensor to measure displacement. Diamond films with different nitrogen levels (0–5%) were deposited on silicon substrates by microwave plasma enhanced chemical vapor deposition. The structural characteristics of these samples are characterized using scanning electron microscopy (SEM), atomic force microscopy (AFM), confocal...

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• Surface quality control of a thin SiN layer by optical measurements

  Publication

  • J. Gierowski
  • S. Pawłowska

  - Photonics Letters of Poland - Year 2021

  Fiber optic interferometers have a wide range of applications, including biological and chemical measurements. Nevertheless, in the case of a reflective interferometer setup, standard silver mirrors cannot be used in every measurement, due to their chemical activity. This work investigates the surface quality of a thin optical layer of silicon nitride (SiN), which can serve as an alternative material for silver mirrors. We present...

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Year 2020

• Incorporation of nitrogen in diamond films - A new way of tuning parameters for optical passive elements

  Publication

  • S. Pawłowska
  • M. Kosowska
  • D. Majchrowicz

  - DIAMOND AND RELATED MATERIALS - Year 2020

  This paper investigates the impact of nitrogen incorporation in diamond films for the construction of an interferometric sensor to measure displacement. Diamond films with different nitrogen levels (0–5%) were deposited on silicon substrates by microwave plasma enhanced chemical vapor deposition. The structural characteristics of these samples are characterized using scanning electron microscopy (SEM), atomic force microscopy...