Search
Abstract
Fiber optic interferometers have a wide range of applications, including biological and chemical measurements. Nevertheless, in the case of a reflective interferometer setup, standard silver mirrors cannot be used in every measurement, due to their chemical activity. This work investigates the surface quality of a thin optical layer of silicon nitride (SiN), which can serve as an alternative material for silver mirrors. We present measurements carried out with a Fabry-Perot fiber-optic interferometer working in a reflective mode. Measurement results allow us to determine the surface quality of the investigated layer.
Citations
-
0
CrossRef
-
0
Web of Science
-
0
Scopus
Cite as
Full text
download paper
downloaded 16 times
- Publication version
- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.4302/plp.v13i3.1096
- License
-
open in new tab
Keywords
Details
- Category:
- Articles
- Type:
- artykuły w czasopismach
- Published in:
-
Photonics Letters of Poland
no. 13,
pages 61 - 63,
ISSN: 2080-2242 - Language:
- English
- Publication year:
- 2021
- Bibliographic description:
- Gierowski J., Pawłowska S.: Surface quality control of a thin SiN layer by optical measurements// Photonics Letters of Poland -Vol. 13,iss. 3 (2021), s.61-63
- DOI:
- Digital Object Identifier (open in new tab) 10.4302/plp.v13i3.1096
- Sources of funding:
-
- Statutory activity/subsidy
- IDUB
- Verified by:
- Gdańsk University of Technology
seen 72 times