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Search results for: LOW-FREQUENCY NOISE
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The Low-frequency Noise of SiC MESFETs
PublicationPrzedstawiono system do pomiaru szumów małoczestotliwościowych tranzystorów SiC MESFET oraz przykładowe wyniki pomiarów.
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A Model for Low Frequency Noise Generation in MOSFETs.
PublicationPrzedstawiono model generacji szumów małoczęstotliwosciowych tranzystora MOS. Model został użyty do symulacji szumów cienkotlenkowych tranzystorów MOS. Wyniki symulacji porównano z danymi pomiarowymi. Zaprezentowano sposób wykorzystania pomiarów szumów m.cz. do wyznaczania niektórych parametrów charakteryzujących tranzystory MOS.
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The Low Frequency Noise Behaviour of SiC MESFETs
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Assessment of Supercapacitor’s Quality by Means of Low Frequency Noise
PublicationLow frequency noise is a well-known tool for quality and reliability assessment of electronic devices. This phenomenon is observed in different electrochemical devices as well (e.g., smart windows, electrochemical corrosion processes). Thus, we can assume that the same tool can be used to asses quality of supercapacitors. Their quality is usually determined only by capacitance and/or equivalent series resistance (ESR), or impedance....
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Shipping Low Frequency Noise and Its Propagation in Shallow Water
PublicationOne of the most significant factor influencing acoustical climate of the sea is underwater noise generated by moving ships. If the considered sea area has features of the shallow water, namely the wave frequency fulfils relation f < 10c/h, where c denotes phase speed of sound, and h is depths of the sea, then in certain distance from the wave source specific image of sound pressure distribution in the mean of wave modes appears....
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Low-frequency noise in ZrS3 van der Waals semiconductor nanoribbons
PublicationWe report the results of the investigation of low-frequency electronic noise in ZrS3 van der Waals semiconductor nanoribbons. The test structures were of the back-gated field-effect-transistor type with a normally off n-channel and an on-to-off ratio of up to four orders of magnitude. The current–voltage transfer characteristics revealed significant hysteresis owing to the presence of deep levels. The noise in ZrS3 nanoribbons...
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A review of design approaches for the implementation of low-frequency noise measurement systems
PublicationElectronic noise has its roots in the fundamental physical interactions between matter and charged particles, carrying information about the phenomena that occur at the microscopic level. Therefore, Low-Frequency Noise Measurements (LFNM) are a well-established technique for the characterization of electron devices and materials and, compared to other techniques, they offer the advantage of being non-destructive and of providing...
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Assessment of Fuel Cells’ State of Health by Low-Frequency Noise Measurements
PublicationWe proposed applying low-frequency (flicker) noise in proton-exchange membrane fuel cells under selected loads to assess their state of health. The measurement set-up comprised a precise data acquisition board and was able to record the DC voltage and its random component at the output. The set-up estimated the voltage noise power spectral density at frequencies up to a few hundred mHz. We observed the evolution of the electrical...
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Low frequency noise and DLTS as silicon solar cell characterization tools
PublicationPraca zawiera wyniki pomiarów DLTS próbek o powierzchni 1 mm2 krzemowych baterii słonecznych wykazujących znaczne niejednorodności wykryte za pomocą metody LBIV (Light Beam Induced Voltage). Wyniki pomiarów charakterystyk stałoprądowych oraz szumowych tych próbek zostały także przedstawione.
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Low Frequency Noise Measurement of Reverse Polarized Silicon Carbide Schottky Diodes
PublicationW artykule przedstawiono wyniki pomiaró szumów cz. wstecznie spolaryzowanych diod Schottky'ego.