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Search results for: semi-contact mode
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Amplitude-distance spectroscopy in semi-contact mode
Open Research DataSince it was invented by Binnig et al. in 1986, atomic force microscopy (AFM) plays a key role in science and technology at the nanoscale. AFM is a microscopic technique that visualizes the surface topography using the attractive and repulsive forces of interaction between several atoms (in theory) of a blade attached to the end of the probe lever and...
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The surface of a fragment of the structure of an integrated circuit in the semi-contact mode.
Open Research DataThe surface of a fragment of the structure of an integrated circuit. Topographic measurements in the semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode.
PublicationThis study presents a novel approach to impedance measurements. The methodology discussed is limited to contact in the sample-probe system under ambient conditions without the presence of electrolyte. Comparison with results of direct and alternating current measurements for well-defined metallic surfaces are made. In spite of idealization related to the type of contact examined, the proposed technique provides an improvement of...
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Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode
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Localized impedance measurements of AA2024 and AA2024‐T3 performed by means of AFM in contact mode
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Localized impedance measurements of AA2024 and AA2024-T3 performed by means of AFM in contact mode
PublicationPurpose: The purpose of this paper is to present the results of an atomic force microscopy (AFM) based approach to local impedance spectroscopy (LIS) measurement performed on AA2024 and AA2024-T3 aluminium alloys. Design/methodology/approach: AFM-LIS measurements were performed ex-situ without the electrolyte environment, so in fact the electrical not electrochemical impedance was obtained. Findings: Relative local impedance values...
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Force-deformation spectroscopy in contact mode
Open Research DataThe deformation-distance spectroscopic curve is obtained by registering the value of the probe cantilever deflection as a function of the elongation of the piezoelectric scanner. It assumes a simple relationship in the form of Hooke’s law, linking the deformation of the lever with the amount of its deflection caused by the proximity of the probe and...
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Fingerprint structure studies with semi-contact AFM
Open Research DataThe work [1] presents many, sometimes even surprising examples of the use of atomic force microscopy in modern forensics. Some of them are projectile tests using the characteristic scratch patterns created by the firing pin on the primer. There are more and more suggestions in the literature for the use of atomic force microscopy in dactyloscopy [2]....
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Electrical mapping of AISI 304 stainless steel subjected to intergranular corrosion performed by means of AFM-LIS in the contact mode
PublicationThe paper presents results of the AFM-based approach to local impedance spectroscopy (LIS) measurements performed in a 20 20 lm grid within an austenite grain–grain boundary region for sensitized AISI 304 stainless steel (SS). Maps of electrical parameters obtained on the basis of localized impedance spectra were demonstrated, presenting their changes and correlation with the sample topography. Performed research revealed significant...
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Mechanical lithography in a polymer substrate using AFM in contact mode
Open Research DataMechanical lithography in a polymer substrate. Contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.