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In-ADC, Rank-Order Filter for Digital Pixel Sensors
PublicationThis paper presents a new implementation of the rank-order filter, which is established on a parallel-operated array of single-slope (SS) analog-to-digital converters (ADCs). The SS ADCs use an “on-the-ramp processing” technique, i.e., filtration is performed along with analog-to-digital conversion, so the final states of the converters represent a filtered image. A proof-of-concept 64 × 64 array of SS ADCs, integrated with MOS...
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An Implementation of a Compact Smart Resistive Sensor Based on a Microcontroller with an Internal ADC
PublicationIn the paper a new implementation of a compact smart resistive sensor based on a microcontroller with internal ADCs is proposed and analysed. The solution is based only on a (already existing in the system) microcontroller and a simple sensor interface circuit working as a voltage divider consisting of a reference resistor and the resistive sensor connected in parallel with an interference suppression capacitor. The measurement...
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Single-Slope ADC With Embedded Convolution Filter for Global-Shutter CMOS Image Sensors
PublicationThis brief presents an analog-to-digital converter (ADC) suitable for acquisition and processing of images in the global-shutter mode at the pixel level. The ADC consists of an analog comparator, a multi-directional shift register for the comparator states, and a 16-bit reversible binary counter with programmable step size. It works in the traditional single-slope mode. The novelty is that during each step of the reference ramp,...
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A method of self-testing of an analog circuit terminated by an ADC in electronic embedded systems controlled by microcontrollers
PublicationA new self-testing method of analog parts terminated by an ADC in electronic embedded systems controlled by microcontrollers is presented. It is based on a new fault diagnosis method based on on-line (i.e. during measurement), transformations of voltage samples of the time response of a tested part to a square pulse - onto localization curves placed in the measurement space. The method can be used for fault detection and single...
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Hybrid‐mode single‐slope ADC with improved linearity and reduced conversion time for CMOS image sensors
PublicationIn the paper, a single‐slope analog‐to‐digital converter (ADC) for integrated CMOS image sensor applications with an improved technique of conversion has been proposed. The proposed hybrid‐mode ADC automatically uses one of the following conversion techniques: time based (i.e. PWM) or voltage based (i.e. single‐slope). During the ADC operation, the clock frequency and reference voltage are modified in order to reduce the conversion...
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A CMOS Pixel With Embedded ADC, Digital CDS and Gain Correction Capability for Massively Parallel Imaging Array
PublicationIn the paper, a CMOS pixel has been proposed for imaging arrays with massively parallel image acquisition and simultaneous compensation of dark signal nonuniformity (DSNU) as well as photoresponse nonuniformity (PRNU). In our solution the pixel contains all necessary functional blocks: a photosensor and an analog-to-digital converter (ADC) with built-in correlated double sampling (CDS) integrated together. It is implemented in...
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An integrated geoarchaeological approach to late Iron Age settlement at Kaštelina hillfort (Lopar, Island of Rab, Croatia) using Amplitude Data Comparison (ADC) method and trial excavation
PublicationGeophysical prospection and small-scale archaeological excavation were undertaken on the site of Kaštelina, a Late Iron Age hillfort settlement located on the Stolac promontory in the northern part of Rab island (Kvarner Gulf, Croatia). Within the frame of the “Archaeological topography of the island of Rab” program, a Polish–Croatian team applied a series of multidisciplinary methods to study the occupational history of the...
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Simple Measurement Method for Resistive Sensors Based on ADCs of Microcontrollers
PublicationA new, complete measurement method for resistance measurement of resistive sensors for systems based on microcontrollers equipped with analog-to-digital converters (ADCs) is proposed. The interface circuit consists of only four resistors, including a resistive sensor and a reference resistor, connected directly to the microcontroller pins. It is activated only during measurements, which significantly reduces power consumption....
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ADCP Observations of Diel Vertical Migration of Biological Layers in Gulf of Gdańsk
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A Power-Efficient Digital Technique for Gain and Offset Correction in Slope ADCs
PublicationIn this brief, a power-efficient digital technique for gain and offset correction in slope analog-to-digital converters (ADCs) has been proposed. The technique is especially useful for imaging arrays with massively parallel image acquisition where simultaneous compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. The presented approach is based on stopping the ADC clock by...