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Search results for: LEAST SQUARES

  • Chemical investigation of the Al2O3 ultra-thin films

    Open Research Data
    open access

    Ultra-thin layers of oluminum oxide (Al2O3) were deposited by ALD method.  Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. Samples with a thickness of 2 and 8 nm of alumina...

  • Depth profile of the composition of 8 nm Al2O3 thin film

    Open Research Data
    open access

    8 nm layer of aluminum oxide (Al2O3) was deposited by ALD method on a s.  Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. To investigate the profile of concenration of...

  • 3D point cloud as a representation of buildings: the Nanotechnology Center and the Auditorium Novum

    Open Research Data
    open access

    The product presents the point cloud in the collection of a three-dimensional database in spatial order as the representations of the Nanotechnology Center and the Auditorium Novum buildings (located on the campus of the Gdańsk University of Technology) acquired in the laser scanning technology. According to its high accuracy and precision of data acquisition...

  • Surface modifcation of PMMA polymer detected by XPS

    Open Research Data
    open access

    In order to obtain the experimental specimens, four PMMA/PC61BM samples with the following  mass proportions were prepared: 10%, 20%, 30%, and 40%. In addition, as a reference, a PMMA sample without  PC61BM was prepared as well. For the fabrication process, PC61BM 99.5% (Solenne BV), chloroform HPLC  (Sigma Aldrich), and PMMA (commercially available...

  • Results after grinding C45 steel

    Open Research Data
    open access

    The database contains results from nanoindenter, scanning microscope and also X-ray diffractometer. To determine the residual stresses and the size of the crystallites in the ferrite grains in the grinded surface layer, the Williamson Hall analysis of the X-ray diffraction patterns was performed. XRD diffraction patterns were also used to perform a...