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Search results for: ROLLING CONTACT FATIGUE (RCF) DEFECTS
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The surface of a fragment of the structure of an integrated circuit in the semi-contact mode.
Open Research DataThe surface of a fragment of the structure of an integrated circuit. Topographic measurements in the semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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Microscopic examination of CuNiFeR pipeline
Open Research DataCopper and nickel alloys called cunifers (Cu, Ni, Fe and R – rest of alloy elements) have found wide application in the production of ship pipeline components in contact with sea water, such as, for example, the main engine cooling system. These alloys are characterized by a very high corrosion resistance, which is ensured by appropriately carried out...
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Macroscopic examination of CuNiFeR pipeline
Open Research DataCopper and nickel alloys called cunifers (Cu, Ni, Fe and R – rest of alloy elements) have found wide application in the production of ship pipeline components in contact with sea water, such as, for example, the main engine cooling system. These alloys are characterized by a very high corrosion resistance, which is ensured by appropriately carried out...
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Tensile test of part of CuNiFeR pipeline
Open Research DataCopper and nickel alloys called cunifers (Cu, Ni, Fe and R – rest of alloy elements) have found wide application in the production of ship pipeline components in contact with sea water, such as, for example, the main engine cooling system. These alloys are characterized by a very high corrosion resistance, which is ensured by appropriately carried out...
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AFM imaging of surface of modern soldering alloy
Open Research DataFollowing the announcement in 2006 of European Union directives aimed at limiting the use of lead in electronic products, there was an urgent need to use lead-free solders in the electronics industry. Due to production requirements, it is necessary to use solders with different melting points. To replace the low-melting eutectic Sn 37 wt. Pb, the most...
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Destruction of AFM probes during normal operation
Open Research DataThe quality of the images obtained with the use of an atomic force microscope is determined by the state of the blade interacting with the tested material. Image artifacts can be generated by various reasons, such as oxidation, contamination or an error in blade fabrication, but also appear as a result of the repeated scanning process and inevitable...