displaying 1000 best results Help
Search results for: semi-contact mode
-
Amplitude-distance spectroscopy in semi-contact mode
Open Research DataSince it was invented by Binnig et al. in 1986, atomic force microscopy (AFM) plays a key role in science and technology at the nanoscale. AFM is a microscopic technique that visualizes the surface topography using the attractive and repulsive forces of interaction between several atoms (in theory) of a blade attached to the end of the probe lever and...
-
The surface of a fragment of the structure of an integrated circuit in the semi-contact mode.
Open Research DataThe surface of a fragment of the structure of an integrated circuit. Topographic measurements in the semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
-
Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode.
PublicationThis study presents a novel approach to impedance measurements. The methodology discussed is limited to contact in the sample-probe system under ambient conditions without the presence of electrolyte. Comparison with results of direct and alternating current measurements for well-defined metallic surfaces are made. In spite of idealization related to the type of contact examined, the proposed technique provides an improvement of...
-
Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode
Publication -
Localized impedance measurements of AA2024 and AA2024‐T3 performed by means of AFM in contact mode
Publication -
Localized impedance measurements of AA2024 and AA2024-T3 performed by means of AFM in contact mode
PublicationPurpose: The purpose of this paper is to present the results of an atomic force microscopy (AFM) based approach to local impedance spectroscopy (LIS) measurement performed on AA2024 and AA2024-T3 aluminium alloys. Design/methodology/approach: AFM-LIS measurements were performed ex-situ without the electrolyte environment, so in fact the electrical not electrochemical impedance was obtained. Findings: Relative local impedance values...
-
Force-deformation spectroscopy in contact mode
Open Research DataThe deformation-distance spectroscopic curve is obtained by registering the value of the probe cantilever deflection as a function of the elongation of the piezoelectric scanner. It assumes a simple relationship in the form of Hooke’s law, linking the deformation of the lever with the amount of its deflection caused by the proximity of the probe and...
-
Fingerprint structure studies with semi-contact AFM
Open Research DataThe work [1] presents many, sometimes even surprising examples of the use of atomic force microscopy in modern forensics. Some of them are projectile tests using the characteristic scratch patterns created by the firing pin on the primer. There are more and more suggestions in the literature for the use of atomic force microscopy in dactyloscopy [2]....
-
Electrical mapping of AISI 304 stainless steel subjected to intergranular corrosion performed by means of AFM-LIS in the contact mode
PublicationThe paper presents results of the AFM-based approach to local impedance spectroscopy (LIS) measurements performed in a 20 20 lm grid within an austenite grain–grain boundary region for sensitized AISI 304 stainless steel (SS). Maps of electrical parameters obtained on the basis of localized impedance spectra were demonstrated, presenting their changes and correlation with the sample topography. Performed research revealed significant...
-
Mechanical lithography in a polymer substrate using AFM in contact mode
Open Research DataMechanical lithography in a polymer substrate. Contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
-
Topographic AFM imaging of the leaf surface with magnification of details of its morphological structure
Open Research DataTopographic imaging of the leaf surface with magnification of details of its morphological structure. Measurements in semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
-
The AFM micrographs of gold nanoparticles on silicon substrate
Open Research DataThe dataset contains the first approach towards AFM topographic imaging of gold nanoparticles synthesized and immobilized on the silicon surface. Measurements were made in the semi-contact mode on the NTEGRA Prima device, manufactured by NT-MDT. Scans were performed with amplitude detection at an operating value of 60% of the free oscillation amplitude....
-
Imaging of graphene surface by means of tapping mode AFM
Open Research DataGraphene [1] is a material consisting of carbon planes with a hexagonal structure. One of the facts of interest from a purely scientific point of view is the very high mobility of electrons in the described material, allowing the study of relativistic effects inside a solid sample. Other features, such as bactericidal activity, make graphene an interesting...
-
Images of topography and mechanical properties (phase imaging) of cast iron samples from water installations
Open Research DataMeasurements in contact and semi-contact mode. NTEGRA Prima (NT-MDT) device. CSG 10.
-
The AFM topographic measurements of the surface heterogeneity of iron hexacyanoferrate on a steel surface
Open Research DataMeasurements in semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
-
Imaging and chemical investigation of silver coating
Open Research DataThe recovery of silver from materials such as plates, still used in clinical radiography [1], or scrap jewelery is still very popular. The subject of the research, part of which was microscopic imaging, was to recreate the behavior of an electrochemically deposited silver coating. The copper electrodes were covered with a layer of silver obtained from...
-
Identification of intermetallic phases in the structure of austenitic steel with use of Scanning Kelvin Probe Microscopy
Open Research DataDelta ferrite is formed in austenitic steels during the solidification of the alloy and its welds. It can also occur as a stable phase in any temperature range in high-alloy austenitic-ferritic steels. Depending on the amount, it can change into gamma and sigma phases and into ferrite with variable chromium content. The main role of delta ferrite in...
-
Microscopic examination of the texture of paper products
Open Research DataAtomic force microscopy (AFM) can be used to study the state of the paper fibers with the aim of providing qualitative and semi-quantitative information on degradation and aging. The work [1] reports the results of tests of various paper products subjected to deliberate aging processes under the influence of various factors. Chemical and biological...
-
Detection of the acoustic interferences during AFM operation
Open Research DataAtomic force microscopy is a particularly complicated surface imaging technique due to the large number of factors that affect the quality of the resulting images. They are obviously difficult and sometimes even impossible to control at the same time. One of such factors may even be the seismological location of the building or the influence of mechanical...
-
The surface of the sensor used in the analysis of odorous substances
Open Research DataHuman industrial activity usually leads to smaller or larger interference with the ecosystem, contributing to changes affecting the quality of life. An example may be the emission of gaseous substances, not necessarily toxic, but due to their intense smell, they can cause discomfort to people exposed to their inhalation. The problem is so important...