Wyszukiwarka
Filtry
wszystkich: 2
Najlepsze wyniki w katalogu: Potencjał Badawczy Pokaż wszystkie wyniki (2)
Wyniki wyszukiwania dla: ADCS
-
Zespół Systemów Mikroelektronicznych
Potencjał Badawczy* projektowania I optymalizacji układów i systemów mikroelektronicznych * zaawansowane metody projektowania i optymalizacji analogowych filtrów aktywnych * programowanie układów scalonych (FPGA, CPLD, SPLD, FPAA) * układy specjalizowane ASIC * synteza systemów o małym poborze mocy * projektowanie topografii układów i zagadnień kompatybilności elektromagnetycznej * modelowania przyrządów półprzewodnikowych * modelowania właściwości...
-
Zespół Metrologii i Optoelektroniki
Potencjał Badawczy* komputerowo wspomagana metrologia i diagnostyka * projektowanie systemów * mikrosystemów i makrosystemów elektronicznych * testowanie i diagnostyka elektroniczna * pomiary właściwości szumowych i zakłóceń * spektroskopia impedancyjna * telemetria i telediagnostyka internetowa * katedra redaguje Metrology and Measurement Systems * kwartalnik PAN znajdujący się na liście JCR
Pozostałe wyniki Pokaż wszystkie wyniki (13)
Wyniki wyszukiwania dla: ADCS
-
Simple Measurement Method for Resistive Sensors Based on ADCs of Microcontrollers
PublikacjaA new, complete measurement method for resistance measurement of resistive sensors for systems based on microcontrollers equipped with analog-to-digital converters (ADCs) is proposed. The interface circuit consists of only four resistors, including a resistive sensor and a reference resistor, connected directly to the microcontroller pins. It is activated only during measurements, which significantly reduces power consumption....
-
A Power-Efficient Digital Technique for Gain and Offset Correction in Slope ADCs
PublikacjaIn this brief, a power-efficient digital technique for gain and offset correction in slope analog-to-digital converters (ADCs) has been proposed. The technique is especially useful for imaging arrays with massively parallel image acquisition where simultaneous compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. The presented approach is based on stopping the ADC clock by...
-
Self-Testing of Analog Parts Terminated by ADCs Based on Multiple Sampling of Time Responses
PublikacjaA new approach for self-testing of analog parts terminated by analog-to-digital converters in mixed-signal electronic microsystems controlled by microcontrollers is presented. It is based upon a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into localization curves placed in a multidimensional measurement space. The method can be used...
-
A measurement method for capacitive sensors based on a versatile direct sensor-to-microcontroller interface circuit
PublikacjaIn the paper, there is presented a new time-domain measurement method for determining the capacitance values of capacitive sensors, dedicated, among others, to capacitive relative humidity sensors. The method is based on a versatile direct sensor-to-microcontroller interface for microcontrollers with internal analog comparators (ACs) and with precision voltage reference sources, e.g. digital-to-analog converters (DACs). The reference...
-
In-ADC, Rank-Order Filter for Digital Pixel Sensors
PublikacjaThis paper presents a new implementation of the rank-order filter, which is established on a parallel-operated array of single-slope (SS) analog-to-digital converters (ADCs). The SS ADCs use an “on-the-ramp processing” technique, i.e., filtration is performed along with analog-to-digital conversion, so the final states of the converters represent a filtered image. A proof-of-concept 64 × 64 array of SS ADCs, integrated with MOS...